Jeol JCM-6000 Plus

Main Specifications
・Magnification: Secondary electron image (×10~60,000),
backscattered electron image (×10~30,000)
・Accelerating voltage: Secondary electron image
(select 5, 10, 15kV), backscattered electron image
(select 10, 15kV)
・Electron gun: Small electron gun with
integrated filament and Wehnelt grid
・Filament current: Standard, high brightness
・Bias voltage: Auto bias method
(linked to accelerating voltage and filament current)
・Detector: Secondary electron detector (E.T. detector).
Backscattered electron detector (semiconductor detector)
Automatic functions: alignment, focus, stigma, contrast,
brightness
Maximum sample size: size up to 70mmΦ, height up to 50mm
PC related: 1 PC unit, 1 monitor
Power supply: Single-phase AC100V 50/60Hz 700VA
Dimensions and weight: (Tube unit) W325×D490×H430mm,
approx. 50kg
(Power supply box) W200×D480×H270mm, approx. 10kg
(Rotary pump) W288.5×D127×H237mm, approx. 9kg

Equipment status
Instruction manual included
EDS and observation materials in the photos are not included.
Startup, vacuuming, high pressure ON,
SEM image confirmation, etc.
have been completed without any problems.