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Digital Instruments, Veeco Instruments Dimension Large Sample Scanning
Ref :
1892631-9-W
Condition :
Used
Manufacturer :
Digital Instruments, Veeco
Model :
Instruments Dimension Large Sample Scanning
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
29 Jan. 2024
Veeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope
Nanoscope III SPM and controller, LSSF large sample scanning stage with 6"x6" xy travel and optical microscope for defining the region to be scanned, acoustic enclosure, DMLS probe, PC, monitors.
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