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Used Inspection equipment

102 results
1

DESKTOP AOI Brand: SAKI Model: BF18D-P40 Year: 2007 Max board dimensions: 250 x 330 mm Circuit board thickn Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

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1

3D Solder Paste Inspection Machine Year: June, 2012 Power: 220V, 1 ph, 50/60Hz Automatic Conveyor Adjust 3D Ca Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

Type: 3D AOI Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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1

Type: 3D SPI The KY8030-3 blends Koh Young’s pioneering technologies with an inspection speed of 91.2 cm2/sec Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

【specification】 Target board: Size: W50×L50mm ~ W250×L330mm Thickness 0.6~2.5mm Weight 500g or less Material g Year(s) : 2016 Location : ASIA (North East)

Price : On request

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1

Brand WIT Type: M size AOI link (VT-S720 connection) Tabletop machine type Board size: X dimension 50~330mm Year(s) : 2013 Location : ASIA (North East)

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6

Machines in working condition - sold as is. Total of 4 units available. CYBEROPTICS QX 500-L is a PC board as Year(s) : 2012 Location : EUROPE (Central and Eastern)

Price : On request

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4

Machine sold as is. COMET VXP-160.15 is an advanced x-ray imaging equipment designed for medical and industri Location : EUROPE (Central and Eastern)

Price : On request

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0

Exterior Dimensions Width 39.370 in (100.0 cm) Depth 98.425 in (250.0 cm) Height 62.992 in (1 Year(s) : 2014 Location : EUROPE (Western and Northern)

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1

Microscope Type Upright Microscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Location : AMERICA North (USA-Canada-Mexico)

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1

Available is a good working condition OMRON VT-S720-A with angle view camera. It is a 2D machine. For furthe Year(s) : 2013 Location : EUROPE (Central and Eastern)

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Nano defect inspection system Version: 300 mm Vintage: 01.11.2001 Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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1

Version: 300 mm As lithography requirements shrink linewidths, wafer nanotopographybecomes critical todevice Location : AMERICA North (USA-Canada-Mexico)

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1

Post Tape Inspection Location : AMERICA North (USA-Canada-Mexico)

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1

Automated Defect Inspection Version: 200 mm A Shut down in Fab. Needs to be removed in the next few weeks. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

Serial Number : I9907023 SMEMA : True Volts : 110 Phase : Single Amps : 2.5 Hertz : 60 Board Flow Direction : Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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1

Specification: Camera: CCD kamera Sony Scale: 4x - 60x Requirements on camera power supply: DC 12V s výkonom 5 Location : EUROPE (Western and Northern)

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1

<b>Brand: Vi Technology</b> <b>Model: 3D SPI In-line</b> <b>Year: 04/2008</b> <u><b>Solder Paste Inspection (A Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

Camera system Spectro I-Lite 19 pixels Camera head with telecentric lens RAM upgrade to 2048 MB Siemens transp Year(s) : 2010 Location : EUROPE (Western and Northern)

Price : On request

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Camera system Spectro I-Lite 19 pixels Camera head with telecentric lens RAM upgrade to 2048 MB Siemens transp Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

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1

Features: Autoamtic optical inspection of PCB’s Inspects SMT & THT components (missing, type polarity Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

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1

SAM Bond Inspection System Location : AMERICA North (USA-Canada-Mexico)

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1

- Post Tape Inspection Tool - SN: 23-770-00-A3-00 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

- Currently Configured for 6"/150mm & 8"/200mm Wafers - Double Darkfield Inspection Tool - SECS II/GEM Communi Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

Inspection Model AOI 3D SQ3000 Location : EUROPE (Western and Northern)

Price : On request

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You can find used Inspection equipment on Wotol

The main manufacturers of Inspection equipment are CyberOptics, KLA-Tencor, Saki, Agilent Technologies, Koh Young, Leica, Leitz, Nikon, Vi Technology, Crown, DS Semicon Co, Hitachi, MVP, NuTek, CyberOptics, Olympus, Photon Dynamics, Rudolph, Spea, YESTech.

The main model CG4000, HSSeries, 8160, IOI-6000 (SV6000), Cybersentry 2000, Ultra 1820, 4040 FLYING, REICHERT Polylite88, INM 20, Co DS-VIS, NSX-105c, SJ50 II XL, 5DX II, Flex Ultra HR, Vi3K, SE300 Ultra, VSS-3C, KY8020T, PA-500SB11, BF942, PA500SB11, S8030 Inline, V850L, LI-2000 , BF , MD-2000 , SE300 , BF942 , 7700 , SP1-TBI , ERGULUXSeries, MHL-525MS, KY8030-L, YTV-F1S, Surfscan 5000, NuTek NTM0501RCM-1000.

HS code 9031 41 00 For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices

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