Perkin Elmer

Perkin Elmer 200 Series UV/Vis Detector

Specification Description
Wavelength range 190-700 nm
Bandwidth 5 nm
Wavelength accuracy +/- 1 nm
Optics Dual beam
Sensitivity Range 0.0005 to 3.000 AUFS in 0.0001 increments from 0.0005 to 0.1, and 0.01 increments above 0.1 AUFS.
Recorder output 10 mV full scale for any selected range.
Computer output 1 V/AU, 0.5 V/AU, 0.2 V/AU (software control)
Noise < +/- 1 x 10 -5 AU, 210-280 nm, 1 sec. rise time, test flowcell.
Drift < 1 x 10 -4 AU/hour, after warm-up
Light sources Deuterium (190-360nm) or Tungsten (360-700nm) prefocused-no adjustment required on replacement.
Leak detection Heated thermistor sensor in glass envelope located in flow cell drip pan
Display Graphic LCD module 240 X 64 pixel. Series 200 standard
Noise filter Digitally controlled active filter with response (RSP) or peak width (PW) selectable from 0.02 to 5.0 seconds in 8 steps.
Number of methods 20 in battery backed memory
Steps per method 20 maximum; multiple simultaneous events may occur in any given step
Method time Up to 999.99 minutes per method
Programmable functions from the front keypad or Turbochrom Time, wavelength, response time, auto-zero, relay closures, method number, number of injections, (method execution via sequence)
Scan Stopped flow scan, scan speed selectable from 0.2 to 1.0 nm/sec
External communications RS-232 for control, down load of methods via Turbochrom and upload of chromatographic data. Max. Chromatographic data rate is 50 data points per second.
Diagnostics Self-testing as per software diagnostic standards
Microprocessor Motorola 68332

This refurbished Perkin Elmer 200 Series UV/Vis Detector is in great condition.