Perkin Elmer Spectrum One, FT-IR Spectrometer
AMERICA North (USA-Canada-Mexico)
- With HATR Sampling Accessory, Diffuse Reflectance Sampling Accessory,
Universal ATR Sampling Accessory
PerkinElmer knows that quality begins with attention to detail.
That’s why the Spectrum One FT-IR system is designed and built by scientists
who understand the rigors of FT-IR analysis within the lab environment.
From avoiding variations in temperature to providing immunity against tilt,shear and vibration,
Spectrum One systems ensure confidence in your results – time after time.
The Spectrum One FT-IR system was designed with quality in mind and includes these features:
Dynascan interferometers –patented by PerkinElmer
• Designed to minimize variability and increase sensitivity
• Provide immunity to tilt,shear and vibration
Temperature-stabilized detectors
• Temperature stabilization ensures that the detector is kept at optimal performance temperature
Source switching
• Enables highest energy output from the source
• Ensures testing sensitivity and permanent instrument optimization
This Spectrum One FT-IR Spectrometer system has just been moved from a working lab.
It comes with the followings:
Spectrum One FT-IR Spectrometer
HATR Sampling Accessory:
• A wide range of optional top-plate materials and angles of incidence is available
• Automatic recognition of top-plate crystal material, crystal angle and serial number
• Displays on-screen the force applied to a sample to ensure sampling reproducibility
Diffuse Reflectance Sampling Accessory:
• Simplifies analysis of powders and difficult solid materials
• Range of sampling tools available to enable the easiest sample preparation
• Sample position is automatically optimized for all samples to improve measurement sensitivity
Universal ATR Sampling Accessory:
• Helps speed analyses by eliminating the need to change accessories to handle different sample types
* Spectrum One FT-IR Spectrometer System is in great condition.