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FEI Magellan SEM scanning electron microscope
Ref :
2040551-18-CP
Condition :
Used
Manufacturer :
FEI
Model :
Magellan SEM
Short Description :
scanning electron microscope
Year(s) :
2009
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
10 Jul. 2024
Elstar XHR electron column, 300v–30kV, Schottky FEG
In lens SE and BSE detector
Everhart-Thornley SE detector (ETD)
vCD backscatter detector
solid state retractable
Win xP OS and FEI xT UI; TSS
networking computer to make IT happy
Five-axis motorized piezo driven compucentric stage
Full coverage for 100mm samples
100mm load lock
Chamber scope for real time observation
Vacuum System: oil free, column IGP x 2
air cooled Turbo and dry PVP
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