Used Metrology and inspection equipment
1,194 resultsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model SPECTRAC Year(s) : 2010 Location : United States (USA)
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More detailsWafer Size 200 mm Fab Section CMP General Product Information Asset Description Ebara 222 Oxide CMP-STI Softw Year(s) : 2000 Location : United States (USA)
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More detailsProbe Equipment 200mm Year(s) : 1995 Location : United States (USA)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Tencor Model UV1280SE Year(s) : 1999 Location : United States (USA)
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More detailsLithography Equipment BI100, s/n: BA002A408JR Year(s) : 2017 Location : United States (USA)
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More detailsMicroscope Inspection Items 300mm Location : United States (USA)
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More details200mm, s/n: PTG00690EX Year(s) : 2000 Location : United States (USA)
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More details300mm, s/n: 530N00151A FEOL CLEAN Year(s) : 2013 Location : United States (USA)
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More details300mm, s/n: 205935 Xray Diffractometers Year(s) : 2011 Location : United States (USA)
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More detailsRaider ECD310 Year(s) : 2009 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Shelby LD10 Vin Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model OP5240I Vintage Year(s) : 1999 Location : United States (USA)
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More detailsAsset Description Focus Ion Beam Mill Software Version Windows Process Focus Ion Beam Mill Hardware Confgurat Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM next Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier KLA Model 2835 Bri Year(s) : 2012 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Failure Analysis Tool Available Date 2024-08-27 General Product Information Vin Year(s) : 2011 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : United States (USA)
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More detailsFab Section Failure Analysis General Product Information Vendor Supplier BRUKER Model D8 Davinci Vintage 2013 Year(s) : 2013 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVISION Year(s) : 2013 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 AIM Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model EDR 5210 Year(s) : 2010 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier BRUKER Model D8 Fabline V Year(s) : 2014 Location : United States (USA)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.